منابع مشابه
Towards Automated Information Factories
There has been a growing trend toward the automated generation of massive data at multiple distributed locations, leading to a future of computing that is data-rich, heterogeneous, distributed, and rife with uncertainty. Examples include systems to monitor the physical world, such as wireless sensor networks, and systems to monitor complex infrastructures, such as distributed Internet monitors....
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Automated deduction is concerned with the mechanization of the deductive process in the fullest meaning of the concept. Mechanization of the deductive process includes not only proving new mathematical results by computer but also formally verifying the correctness of (certain properties of) computer chip designs and programs and even deducing the programs themselves from formal specifications ...
متن کامل1 Integrated Automated / Robotic On - site Factories
In this volume all worldwide conducted approaches following an on-site factory approach were analysed. Thirty different systems were identified, resulting in an application of automated/robotic on-site factory technology about 60 times.The analysis was for each system split into a more technical part and a part that focuses on indicators related to productivity, efficiency, and economic perform...
متن کاملWhat's Ahead in Automated Lumber Grading
This paper discusses how present scanning technologies are being applied to automatic lumber grading. The presentation focuses on 1) what sensing and scanning devices are needed to measure information for accurate grading feature detection, 2) the hardware and software needed to efficiently process this information, and 3) specific issues related to softwood lumber grading and hardwood lumber g...
متن کاملEffects of Metrology Load Port Buffering in Automated 300mm Factories
This report describes a simulation study characterizing the advantages and disadvantages of implementing multiple load ports on metrology equipment in a semiconductor factory. Three methods of automated material handling (AMH) for 300 mm wafer carriers in four separate models were analyzed: Through Stocker, Point-to-Point, and Conveyor (slow and fast velocity). Parameters measured include idle ...
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ژورنال
عنوان ژورنال: Nature
سال: 1992
ISSN: 0028-0836,1476-4687
DOI: 10.1038/357100b0